Xiao-Feng Zhang,
Ze Zhang
Springer Berlin Heidelberg
2001e druk, 2001
9783540676812
Progress in Transmission Electron Microscopy 2
Applications in Materials Science
Specificaties
Gebonden, 307 blz.
|
Engels
Springer Berlin Heidelberg |
2001e druk, 2001
ISBN13: 9783540676812
Rubricering
Onderdeel van serie
Springer Series in Surface Sciences
Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Specificaties
ISBN13:9783540676812
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:307
Uitgever:Springer Berlin Heidelberg
Druk:2001
Inhoudsopgave
1. The Guidance Role of HRTEM in Developing Mesoporous Molecular Sieves.- 2. HREM Study of Carbon Nanoclusters Grown from Carbon Arc-Discharge.- 3. Determining the Helicity of Carbon Nanotubes by Electron Diffraction.- 4. Low-Dimensional Materials and their Microstructures Studied by High-Resolution Electron Microscopy.- 5. Microstructure of High-Tc Superconducting Josephson Junctions.- 6. Swift Heavy Ion Irradiation Damage in Superconductors.- 7. TEM Investigations of Misfit Dislocations in Lattice-Mismatched Semiconductor Heterostructures.- 8. Dislocated Contrast Analysis.- 9. Transmission Electron Cryomicroscopy and Three-Dimensional Reconstruction of Macromolecular Complexes.